Title :
X-ray versus 3D terahertz imaging for sigillography science
Author :
Durand, R. ; Guillet, J.P. ; Recur, Benoit ; Mounaix, Patrick ; Fabre, M. ; Genot, S.
Author_Institution :
LOMA, Bordeaux 1 Univ., Talence, France
Abstract :
This study focuses on the seals, especially European wax seals. We use THz spectroscopy imaging for non-destructive evaluation of natural materials. Using a time domain THz spectroscopy and imaging system, THz reflection images are generated in the 0.1-3 THz range and demonstrate that we can inspect the internal structure under a thick layer of old wax. X-Ray images will be used as a reference and the both technologies will be compared.
Keywords :
X-ray imaging; terahertz wave imaging; 3D terahertz imaging; European wax seals; X-ray terahertz imaging; frequency 0.1 THz; natural materials; nondestructive evaluation; sigillography science; thick layer; Chemicals; Materials; Seals; Technological innovation; Three-dimensional displays; X-ray imaging;
Conference_Titel :
Infrared, Millimeter, and Terahertz Waves (IRMMW-THz), 2013 38th International Conference on
Conference_Location :
Mainz
DOI :
10.1109/IRMMW-THz.2013.6665824
