DocumentCode :
644857
Title :
Quarter waveplate at upper terahertz range based on form birefringence
Author :
Banghong Zhang ; Yandong Gong ; Notake, Takashi ; Minamide, Hiroaki
Author_Institution :
Inst. for Infocomm Res., Singapore, Singapore
fYear :
2013
fDate :
1-6 Sept. 2013
Firstpage :
1
Lastpage :
2
Abstract :
Quarter waveplates (QWPs) at upper terahertz range are demonstrated based on form birefringence of silicon grating. With depth of 15.5 and 8.4 μm, the gratings act as QWPs at 4.9 and 9.5 THz, respectively. The QWP is also successfully used to measure the state of polarization in a polarimetric system.
Keywords :
birefringence; diffraction gratings; elemental semiconductors; light polarisation; microwave photonics; optical retarders; polarimetry; silicon; Si; birefringence; frequency 4.9 THz; frequency 9.5 THz; polarimetric system; polarization state; quarter waveplate; silicon grating; upper terahertz range; Cadmium; Equations; Gratings;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Infrared, Millimeter, and Terahertz Waves (IRMMW-THz), 2013 38th International Conference on
Conference_Location :
Mainz
Type :
conf
DOI :
10.1109/IRMMW-THz.2013.6665828
Filename :
6665828
Link To Document :
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