DocumentCode :
644906
Title :
Effects of thin dielectric layer on plasmon excitation in perforated metal films
Author :
Kaveckyte, V. ; Venckevicius, R. ; Minkevicius, L. ; Voisiat, B. ; Raciukaitis, G. ; Valusis, G. ; Kasalynas, I.
Author_Institution :
Center for Phys. Sci. & Technol., Vilnius, Lithuania
fYear :
2013
fDate :
1-6 Sept. 2013
Firstpage :
1
Lastpage :
2
Abstract :
Transmission and reflection spectra of resonant metallic filters fabricated by the laser direct writing technique were investigated in terahertz frequency range. Effect of thin dielectric layer on surface waves excitation was observed as a larger redshift of the transmittance peak dependent of dielectric film thickness and metal film surface smoothness.
Keywords :
dielectric thin films; laser deposition; metallic thin films; surface plasmons; surface roughness; dielectric film thickness; laser direct writing technique; metal film surface smoothness; perforated metal films; plasmon excitation; reflection spectra; resonant metallic filters; surface wave excitation; terahertz frequency; thin dielectric layer effects; transmission spectra; transmittance peak redshift; Optical films; Optical imaging; Phase locked loops; Resonant frequency;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Infrared, Millimeter, and Terahertz Waves (IRMMW-THz), 2013 38th International Conference on
Conference_Location :
Mainz
Type :
conf
DOI :
10.1109/IRMMW-THz.2013.6665878
Filename :
6665878
Link To Document :
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