DocumentCode :
644941
Title :
THz metrology
Author :
Kleine-Ostmann, Thomas
Author_Institution :
Phys.-Tech. Bundesanstalt (PTB), Braunschweig, Germany
fYear :
2013
fDate :
1-6 Sept. 2013
Firstpage :
1
Lastpage :
4
Abstract :
The term metrology refers to the art and science of measurement. In the last three hundred years approaches and tools have been developed that allow for precise and reliable measurements with known measurement uncertainty in a multitude of disciplines in physics and technology. Trust in measurement results, comparability and interoperability are crucial for technology in everyday life. With the advent of THz science and technology new sophisticated measurement techniques have been developed that allow for insights that cannot be obtained otherwise. By now commercial systems making use of THz radiation are appearing on the market and the question of the reliability of measurements becomes increasingly important.
Keywords :
microwave measurement; terahertz spectroscopy; terahertz wave detectors; measurement techniques; measurement uncertainty; terahertz metrology; terahertz science; Calibration; Frequency measurement; Measurement uncertainty; Metrology; Optimized production technology; Spectroscopy; Standards;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Infrared, Millimeter, and Terahertz Waves (IRMMW-THz), 2013 38th International Conference on
Conference_Location :
Mainz
Type :
conf
DOI :
10.1109/IRMMW-THz.2013.6665913
Filename :
6665913
Link To Document :
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