• DocumentCode
    644941
  • Title

    THz metrology

  • Author

    Kleine-Ostmann, Thomas

  • Author_Institution
    Phys.-Tech. Bundesanstalt (PTB), Braunschweig, Germany
  • fYear
    2013
  • fDate
    1-6 Sept. 2013
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    The term metrology refers to the art and science of measurement. In the last three hundred years approaches and tools have been developed that allow for precise and reliable measurements with known measurement uncertainty in a multitude of disciplines in physics and technology. Trust in measurement results, comparability and interoperability are crucial for technology in everyday life. With the advent of THz science and technology new sophisticated measurement techniques have been developed that allow for insights that cannot be obtained otherwise. By now commercial systems making use of THz radiation are appearing on the market and the question of the reliability of measurements becomes increasingly important.
  • Keywords
    microwave measurement; terahertz spectroscopy; terahertz wave detectors; measurement techniques; measurement uncertainty; terahertz metrology; terahertz science; Calibration; Frequency measurement; Measurement uncertainty; Metrology; Optimized production technology; Spectroscopy; Standards;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Infrared, Millimeter, and Terahertz Waves (IRMMW-THz), 2013 38th International Conference on
  • Conference_Location
    Mainz
  • Type

    conf

  • DOI
    10.1109/IRMMW-THz.2013.6665913
  • Filename
    6665913