Title :
Application of FMEA to optimize selection of hazard mitigation measures
Author_Institution :
GE Energy, Sharonville, OH, USA
Abstract :
Failure Mode and Effects Analysis is a common analytical method utilized in product development, manufacturing, quality control, and maintenance to better understand potential failure modes and the effects that design changes or process changes would have on those failure modes. Valdes [1] has proposed an adaptation of FMEA suitable for analyzing hazards and the effects of various hazard mitigation measures in the context of specific tasks that are performed on hazardous equipment or a hazardous system. The effects of each hazard mitigation solution on the frequency each task is performed, likelihood of an incident, and severity of the resultant incident are analyzed for each activity performed on the system. The relative hazard reduction of the mitigation solution may then be compared with the cost of implementing the solution. Multiple solutions can be analyzed and the level of hazard reduction vs. the cost of implementing the solution can be ranked according to cost-effectiveness. This analysis can be used to develop a business case for implementing hazard mitigation projects or features within planned projects. This paper details how one facility utilized the FMEA-based hazard analysis tool developed by Valdes to assess hazards present in existing facilities and new facilities that were in the design stages.
Keywords :
failure analysis; hazards; FMEA; design changes; failure mode and effects analysis; hazard mitigation measures selection; hazardous equipment; hazardous system; maintenance; manufacturing; process changes; product development; quality control; relative hazard reduction; Employment; Feeds; Frequency measurement; Hazards; Substations; Switchgear; ANSI Z10; Arc-flash mitigation; FMEA; Hazard Risk Analysis; Likelihood; NFPA 70E;
Conference_Titel :
Petroleum and Chemical Industry Technical Conference (PCIC), 2013 Record of Conference Papers Industry Applications Society 60th Annual IEEE
Conference_Location :
Chicago, IL
Print_ISBN :
978-1-4673-5108-9
DOI :
10.1109/PCICon.2013.6666037