DocumentCode
644993
Title
A more insightful dimension of standard electrical field tests for transformer diagnostics
Author
Duplessis, Jill
Author_Institution
OMICRON Electron. USA, Waltham, MA, USA
fYear
2013
fDate
23-25 Sept. 2013
Firstpage
1
Lastpage
11
Abstract
The Variable Frequency Power Factor (VFPF), Frequency Response of Stray Losses (FRSL), and Dynamic DC Winding Resistance tests are reviewed in this paper. These electrical field tests provide significant new diagnostic detail resulting in a more comprehensive assessment of the condition of a transformer. These tools are not radically different from three standard electrical tests that have been in use for decades in the industry. In fact, the test set up, connections, and test implementation requirements from a tester´s perspective are identical to those for the Power Factor, Leakage Reactance and DC Winding Resistance tests, respectively. The subject diagnostics have progressed from these traditional tests, gaining their unique, diagnostic prowess by simply expanding the related, standard test´s measurement(s) in the frequency or time domains. VFPF, FRSL, and Dynamic DC Winding Resistance tests do not displace these older diagnostic tools but rather supplement them, bringing considerable and, in the case of the VFPF test, disproportionately more value.
Keywords
power factor; power transformer testing; windings; DC winding resistance tests; electrical field tests; leakage reactance; stray losses frequency response; transformer diagnostics; variable frequency power factor; Dielectrics; Frequency measurement; Insulation; Pollution measurement; Power measurement; Power transformer insulation; Reactive power; Dynamic DC Winding Resistance; Frequency Response of Stray Losses (FRSL); Variable Frequency Power Factor (VFPF); conductivity; eddy loss; load tap changer; polarization; short circuit impedance; strand-to-strand short circuits;
fLanguage
English
Publisher
ieee
Conference_Titel
Petroleum and Chemical Industry Technical Conference (PCIC), 2013 Record of Conference Papers Industry Applications Society 60th Annual IEEE
Conference_Location
Chicago, IL
ISSN
0090-3507
Print_ISBN
978-1-4673-5108-9
Type
conf
DOI
10.1109/PCICon.2013.6666041
Filename
6666041
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