Title :
The frequency band where the solution to Maxwell´s equations is unknown —A challenge facing the analysis of multiscale problems and its solution
Author :
Jianfang Zhu ; Omar, Saad ; Dan Jiao
Author_Institution :
Intel Corp., Santa Clara, CA, USA
Abstract :
The problems encountered in the system-level analysis and design of integrated circuits (IC) are multiscaled in nature, the geometric scales of which range from centimeter to nanometer. For such multiscale problems, in this paper, we demonstrate, both theoretically and numerically, that there exists a band of frequencies in which the solution to Maxwell´s equations is unknown. This is because in this band, traditional fullwave solvers break down due to finite machine precision while static and quasistatic solvers are invalid, i.e. the solution at the breakdown frequencies of traditional fullwave solvers is a fullwave solution. As a result, the prevailing approach for broadband IC design, which stitches the results from a fullwave solver at high frequencies with those from static/quasi-static solvers at low frequencies, can be totally incorrect when applied in a multiscale setting. Consequently, to sustain the continued scaling of integrated circuits, it is important to find the solution to the original fullwave Maxwell´s equation in a complete electromagnetic spectrum, whether high or low. Such a universal solution has been developed in [1]. In this work, in addition to demonstrating the existence of a frequency band where the solution of Maxwell´s equations is unknown from existing electromagnetic solvers, we present a fast algorithm to find the unknown solution, thus addressing a major challenge in multiscale analysis.
Keywords :
Maxwell equations; integrated circuit design; Maxwell´s equations; broadband IC design; electromagnetic solvers; electromagnetic spectrum; finite machine precision; frequency band; fullwave Maxwell´s equation; fullwave solvers; geometric scales; integrated circuit design; multiscale analysis; multiscale problems; system-level analysis; Eigenvalues and eigenfunctions; Electric breakdown; Impedance; Integrated circuits; Mathematical model; Maxwell equations; Vectors;
Conference_Titel :
Electromagnetic Compatibility (EMC), 2013 IEEE International Symposium on
Conference_Location :
Denver, CO
Print_ISBN :
978-1-4799-0408-2
DOI :
10.1109/ISEMC.2013.6670375