Title :
Critical equipment input impedance measurement for IEMI calculations
Author :
Mora, Nicolas ; Salvatierra, M.J. ; Romero, C. ; Rachidi, Farhad ; Rubinstein, Marcos
Author_Institution :
EMC Lab., EPFL, Lausanne, Switzerland
Abstract :
In this work, we discuss the need for measuring the input impedance of critical equipment for correctly modelling the IEMI coupling to critical infrastructures. A measurement methodology that employs a traditional VNA and a test fixture for retrieving the differential input impedance of an N-port network is presented. The advantage of the proposed method is that it permits the measurement of the differential impedance among all the input ports of the same equipment under test by using a conventional two-port VNA.
Keywords :
electric impedance measurement; electromagnetic interference; IEMI calculations; IEMI coupling; N-port network; VNA; critical equipment input impedance; critical equipment input impedance measurement; differential impedance; differential input impedance; intentional electromagnetic interference; two-port VNA; Connectors; Fixtures; Impedance; Impedance measurement; Ports (Computers); Power measurement; Transmission line measurements;
Conference_Titel :
Electromagnetic Compatibility (EMC), 2013 IEEE International Symposium on
Conference_Location :
Denver, CO
Print_ISBN :
978-1-4799-0408-2
DOI :
10.1109/ISEMC.2013.6670449