DocumentCode :
646738
Title :
SE measurements with a TEM cell to study gasket reliability
Author :
Faraji, Parisa ; Drewniak, James L. ; McBain, Douglas S. ; Pommerenke, David
Author_Institution :
Laird Technol., Detroit, MI, USA
fYear :
2013
fDate :
5-9 Aug. 2013
Firstpage :
462
Lastpage :
465
Abstract :
In this paper a near-field Shielding Effectiveness measurement approach for highly conductive gaskets while maintaining the interface is presented. SE measurements of initial gasket performance along with reliability data in hostile environments are vital for predicting a gasket performance in conjunction with specific joint surfaces. The TEM cell method reported herein offers an analytical approach for studying aging and reliability of gaskets and metal contact interfaces in place. Preserving the gasket-metal interface is critical throughout the testing and aging steps, which is an important advantage of this methodology.
Keywords :
TEM cells; ageing; data communication; electromagnetic shielding; gaskets; reliability; SE measurements; TEM cell method; aging steps; analytical approach; conductive gaskets; gasket reliability; gasket-metal interface; gaskets aging; gaskets reliability; hostile environments; initial gasket performance; metal contact interfaces; near-field shielding effectiveness measurement; reliability data; shielding effectiveness; testing; Floors; Gaskets; Loss measurement; Noise; TEM cells; Transmission line measurements;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electromagnetic Compatibility (EMC), 2013 IEEE International Symposium on
Conference_Location :
Denver, CO
ISSN :
2158-110X
Print_ISBN :
978-1-4799-0408-2
Type :
conf
DOI :
10.1109/ISEMC.2013.6670457
Filename :
6670457
Link To Document :
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