Title :
Investigation of interference in a mobile phone from a DC-to-DC converter
Author :
Shinde, Satyajeet ; Radchenko, Andriy ; Jingnan Pan ; Kang Sung-Hee ; Dongjin Kim ; Sangyeob Lee ; Jun Fan ; Pommerenke, David
Author_Institution :
Missouri S&T EMC Lab., Missouri Univ. of Sci. & Technol., Rolla, MO, USA
Abstract :
Turning on the LCD screen of a mobile phone causes desensitization of its receiver in the GSM lower frequency band (900 MHz). In this paper, the measurement techniques used for the investigation of intra-system interference in a mobile phone caused due to the DC-DC converters present on-chip the LCD driver IC are presented. An equivalent noise source model is created by modelling the flexible printed circuit board traces and obtaining a Thevenin equivalent noise by changing the load conditions.
Keywords :
cellular radio; driver circuits; integrated circuit measurement; integrated circuit modelling; integrated circuit noise; liquid crystal displays; mobile handsets; printed circuits; radio receivers; radiofrequency interference; radiotelemetry; DC-DC converter; GSM; LCD driver IC; LCD screen; Thevenin equivalent noise; equivalent noise source model; flexible printed circuit board; frequency 900 MHz; intrasystem interference investigation; measurement technique; mobile phone; receiver; Antenna measurements; Flexible printed circuits; Integrated circuit modeling; Noise; Noise measurement; Temperature measurement;
Conference_Titel :
Electromagnetic Compatibility (EMC), 2013 IEEE International Symposium on
Conference_Location :
Denver, CO
Print_ISBN :
978-1-4799-0408-2
DOI :
10.1109/ISEMC.2013.6670485
