Double position-signal-difference method for electric near-field measurements

Author

Funato, Hirohito ; Suga, Takashi ; Suhara, Michihiko

Author_Institution

Electron. Syst. Dept., Hitachi Ltd., Hitachi, Japan

fYear

2013

fDate

5-9 Aug. 2013

Firstpage

621

Lastpage

625

Abstract

A position/signal difference method for electric near-field measurements has been investigated and extended to a double position/signal difference method in order to independently extract the normal and tangential electric near-field components using two measurements at slightly different heights above the test object. A printed monopole probe was fabricated and used for electric near-field measurements above a microstrip line using the proposed method. In addition, full-wave electromagnetic simulations were carried out and the measured normal and tangential components were found to be in good agreement with the simulation results at 1 GHz.

Keywords

UHF measurement; electric field measurement; microstrip lines; probes; double position-signal-difference method; electric near-field measurement; frequency 1 GHz; full-wave electromagnetic simulation; microstrip line; normal electric near-field component extraction; position-signal difference method; printed monopole probe; tangential electric near- field component extraction; Electric variables measurement; Magnetic field measurement; Microwave measurement; Position measurement; Probes; Semiconductor device measurement; Spatial resolution; electric near-field; probe; spatial resolution;

fLanguage

English

Publisher

ieee

Conference_Titel

Electromagnetic Compatibility (EMC), 2013 IEEE International Symposium on

Conference_Location

Denver, CO

ISSN

2158-110X

Print_ISBN

978-1-4799-0408-2

Type

conf

DOI

10.1109/ISEMC.2013.6670486

Filename

6670486