Title :
Double position-signal-difference method for electric near-field measurements
Author :
Funato, Hirohito ; Suga, Takashi ; Suhara, Michihiko
Author_Institution :
Electron. Syst. Dept., Hitachi Ltd., Hitachi, Japan
Abstract :
A position/signal difference method for electric near-field measurements has been investigated and extended to a double position/signal difference method in order to independently extract the normal and tangential electric near-field components using two measurements at slightly different heights above the test object. A printed monopole probe was fabricated and used for electric near-field measurements above a microstrip line using the proposed method. In addition, full-wave electromagnetic simulations were carried out and the measured normal and tangential components were found to be in good agreement with the simulation results at 1 GHz.
Keywords :
UHF measurement; electric field measurement; microstrip lines; probes; double position-signal-difference method; electric near-field measurement; frequency 1 GHz; full-wave electromagnetic simulation; microstrip line; normal electric near-field component extraction; position-signal difference method; printed monopole probe; tangential electric near- field component extraction; Electric variables measurement; Magnetic field measurement; Microwave measurement; Position measurement; Probes; Semiconductor device measurement; Spatial resolution; electric near-field; probe; spatial resolution;
Conference_Titel :
Electromagnetic Compatibility (EMC), 2013 IEEE International Symposium on
Conference_Location :
Denver, CO
Print_ISBN :
978-1-4799-0408-2
DOI :
10.1109/ISEMC.2013.6670486
