Title :
Signal integrity enhancement of high-speed digital interconnect with discontinuous and asymmetric structures for mobile applications
Author :
Tae-Wan Koo ; Hee-Do Kang ; Jeunguk Ha ; Eunkwang Koh ; Jong-Gwan Yook
Author_Institution :
Dept. of Electr. & Electron. Eng., Yonsei Univ., Seoul, South Korea
Abstract :
In this paper, signal integrity (SI) of a mobile high-definition link (MHL) system is analyzed, having the discontinuous and asymmetric structures. In the SI analysis of the MHL system, three dimensional (3D) electromagnetic (EM) solver and time domain reflectometry (TDR) method are carried out. As a result, the differential signals with the discontinuous reference plane experience the degeneration of transmission characteristic due to the impedance mismatch, rendering by discontinuities in return current path of the signals. Moreover, it is found that the SI characteristic of the differential signal could be significantly degenerated, when the asymmetric guard traces with ground vias for electromagnetic interference (EMI) reduction are located closer to the signal trace than the balanced reference plane. Therefore, SI can be guaranteed with widely open eye diagram using the symmetric and continuous reference plane for the coupled signal lines in the high-speed digital interconnect.
Keywords :
electric impedance; high-speed techniques; interconnections; mobile radio; radio links; radiofrequency interference; radiowave propagation; signal processing; 3D EM solver; MHL system; SI analysis; TDR method; asymmetric guard traces; asymmetric structures; continuous reference plane; differential signals; discontinuous reference plane; discontinuous structures; high-speed digital interconnection; mobile applications; mobile high definition link system; signal integrity enhancement; symmetric reference plane; three dimensional electromagnetic solver; time domain reflectometry method; transmission characteristic; Electromagnetic interference; Impedance; Integrated circuit interconnections; Mobile communication; Silicon; Three-dimensional displays; Time-domain analysis;
Conference_Titel :
Electromagnetic Compatibility (EMC), 2013 IEEE International Symposium on
Conference_Location :
Denver, CO
Print_ISBN :
978-1-4799-0408-2
DOI :
10.1109/ISEMC.2013.6670503