One-port time domain measurement technique for quality factor estimation of loaded and unloaded cavities

In this paper a one-port time domain measurement technique for quality factor estimation of a loaded and unloaded metallic cavity is presented. By observing the power decay profile of S₁₁ the quality factor can be computed. Validation of the one-port time domain technique is done by comparing quality factor estimation with the Q estimations from both two-port frequency and time domain data. The usefulness of the one-port time domain technique is also demonstrated using a physically small but electrically large cavity with different types of RF absorber material.