DocumentCode
64691
Title
Board-Level Functional Fault Diagnosis Using Multikernel Support Vector Machines and Incremental Learning
Author
Fangming Ye ; Zhaobo Zhang ; Chakrabarty, Krishnendu ; Xinli Gu
Author_Institution
Dept. of Electr. & Comput. Eng., Duke Univ., Durham, NC, USA
Volume
33
Issue
2
fYear
2014
fDate
Feb. 2014
Firstpage
279
Lastpage
290
Abstract
Advanced machine learning techniques offer an unprecedented opportunity to increase the accuracy of board-level functional fault diagnosis and reduce product cost through successful repair. Ambiguous or incorrect diagnosis results lead to long debug times and even wrong repair actions, which significantly increase repair cost. We propose a smart diagnosis method based on multikernel support vector machines (MK-SVMs) and incremental learning. The MK-SVM method leverages a linear combination of single kernels to achieve accurate faulty-component classification based on the errors observed. The MK-SVMs thus generated can also be updated based on incremental learning, which allows the diagnosis system to quickly adapt to new error observations and provide even more accurate fault diagnosis. Two complex boards from industry, currently in volume production, are used to validate the proposed diagnosis approach in terms of diagnosis accuracy (success rate) and quantifiable improvements over previously proposed machine-learning methods based on several single-kernel SVMs and artificial neural networks.
Keywords
electronic engineering computing; fault diagnosis; learning (artificial intelligence); neural nets; printed circuit testing; support vector machines; MK-SVM method; advanced machine learning technique; artificial neural network; board level functional fault diagnosis; faulty component classification; linear combination; multikernel support vector machine; smart diagnosis method; Accuracy; Circuit faults; Fault diagnosis; Kernel; Maintenance engineering; Support vector machines; Training; Board-level fault diagnosis; functional failures; incremental learning; kernel; machine learning; support-vector machines;
fLanguage
English
Journal_Title
Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on
Publisher
ieee
ISSN
0278-0070
Type
jour
DOI
10.1109/TCAD.2013.2287184
Filename
6714627
Link To Document