Letter from the editor

Welcome to our annual symposium issue that features news from the 2013 IEEE International Symposium on Electromagnetic Compatibility (EMC) held in Denver, Colorado. I hope you enjoy the many articles on symposium activity and appreciate the photos contributed by our capable team of EMC Society photographers shown on page 8. Their photos help bring the articles to life and provide recognition for the speakers, exhibitors, the countless volunteers, the awardees and others who contributed to the success of the symposium.