• DocumentCode
    64736
  • Title

    Letter from the editor

  • Volume
    2
  • Issue
    4
  • fYear
    2013
  • fDate
    4th Quarter 2013
  • Firstpage
    4
  • Lastpage
    8
  • Abstract
    Welcome to our annual symposium issue that features news from the 2013 IEEE International Symposium on Electromagnetic Compatibility (EMC) held in Denver, Colorado. I hope you enjoy the many articles on symposium activity and appreciate the photos contributed by our capable team of EMC Society photographers shown on page 8. Their photos help bring the articles to life and provide recognition for the speakers, exhibitors, the countless volunteers, the awardees and others who contributed to the success of the symposium.
  • fLanguage
    English
  • Journal_Title
    Electromagnetic Compatibility Magazine, IEEE
  • Publisher
    ieee
  • ISSN
    2162-2264
  • Type

    jour

  • DOI
    10.1109/MEMC.2013.6714685
  • Filename
    6714685