Laser Testing Methodology for Diagnosing Diverse Soft Errors in a Nanoscale SRAM-Based FPGA

Author

Lima Kastensmidt, Fernanda ; Tambara, L. ; Bobrovsky, Dmitry V. ; Pechenkin, Alexander A. ; Nikiforov, Alexander Y.

Author_Institution

PGMICRO, UFRGS, Porto Alegre, Brazil

Volume

61

Issue

6

fYear

2014

fDate

Dec. 2014

Firstpage

3130

Lastpage

3137

Abstract

In this paper, we propose a method that combines dedicated test designs, readback and bitstream comparisons to investigate soft errors in a nanoscale SRAM-based FPGA under photoelectric stimulation. Static test is performed to analyze the SEU dependency to voltage supply. Static cross-section and threshold energy are presented. Dynamic test is accomplished by using a set of designs in order to diagnose errors from SET in the logic clock tree, SEU in embedded soft-core processor and in the reconfigurable ICAP interface. A picosecond laser is used in the experiments.

Keywords

SRAM chips; dynamic testing; field programmable gate arrays; integrated circuit testing; laser beam applications; microprocessor chips; radiation hardening (electronics); SET; SEU dependency; dynamic test; laser testing methodology; logic clock tree; nanoscale SRAM-based FPGA; photoelectric stimulation; picosecond laser; reconfigurable ICAP interface; single event transient; single event upset; soft errors; soft-core processor; static cross-section; static test; threshold energy; Circuit faults; Field programmable gate arrays; SRAM cells; Single event transients; Single event upsets; Testing; Laser testing; SRAM-based FPGAs; soft errors;

fLanguage

English

Journal_Title

Nuclear Science, IEEE Transactions on

Publisher

ieee

ISSN

0018-9499

Type

jour

DOI

10.1109/TNS.2014.2369008

Filename

6969839