Title :
Half-Rate Clock-Embedded Source Synchronous Transceivers in 130-nm CMOS
Author :
Kyongsu Lee ; Jae-Yoon Sim
Author_Institution :
Dept. of Electr. Eng., Pohang Univ. of Sci. & Technol., Pohang, South Korea
Abstract :
This paper describes the characteristics of a half-rate clock-embedded source-synchronous signaling scheme to identify its constraints and to optimize the transceiver topology in the presence of a band-limited channel. The proposed signaling combines the half-rate clock to the common mode of the differential data with its mixing phase off by 0.5 UI. Two transceivers with resistive-load and inductive-load receivers are implemented in 130-nm CMOS technology to verify their feasibility for use as serial links. The prototype transceivers achieve a wide operating frequency range 2.25-6 and 5.6-8 Gb/s, respectively, satisfying bit error rate of <;10-12 measured at Tx-Rx linked configuration by 5-in-long FR4 trace with 231-1 PRBS. The power efficiencies of transceivers at maximum data rates are 6.4 and 4.6 mW/Gb/s, respectively.
Keywords :
CMOS analogue integrated circuits; radio transceivers; 5-in-long FR4 trace; CMOS technology; Tx-Rx linked configuration; band-limited channel; bit error rate; bit rate 2.25 Gbit/s to 8 Gbit/s; differential data; half-rate clock-embedded source synchronous transceivers; half-rate clock-embedded source-synchronous signaling scheme; inductive-load receiver; prototype transceivers; resistive-load receiver; serial links; size 130 nm; transceiver power efficiency; transceiver topology; Clocks; Delays; Equalizers; Jitter; Synchronization; Transceivers; Uncertainty; Clock and data recovery (CDR); clock-embedded source-synchronous (CESS) signaling; high-speed I/O; transceivers; transceivers.;
Journal_Title :
Very Large Scale Integration (VLSI) Systems, IEEE Transactions on
DOI :
10.1109/TVLSI.2013.2283853