Functional fault model definition for bus testing

In this paper we present a new fault model for testing bus components using their functionality. With the aim of a new fault model definition all components in a bus except cores of the SoC will be tested as fast as possible. According to the proposed method in this paper, at first, wires and small components will be tested by marching test patterns as the test data and, after that based on a proposed method; the new format faults for the bus will be used. Using AMBA-AHB as the experimental result, the new fault model shows efficiency in comparison with corresponding stuck-at.