DocumentCode
648531
Title
An approach to accelerated life tests of electronic components
Author
Andrey, Krylov ; Mikhail, Karpov ; Svetlana, Prischepova
fYear
2013
fDate
27-30 Sept. 2013
Firstpage
1
Lastpage
3
Abstract
This article is devoted to the problems of conducting life tests of electronic components and to the ways of solving these problems. The need for research in the field of accelerated life tests is shown. A physics-of-failure approach to life tests with accent on parametric failures (due to aging) is considered.
Keywords
failure analysis; life testing; accelerated life tests; electronic components; parametric failures; physics-of-failure approach;
fLanguage
English
Publisher
ieee
Conference_Titel
Design & Test Symposium, 2013 East-West
Conference_Location
Rostov-on-Don
Print_ISBN
978-1-4799-2095-2
Type
conf
DOI
10.1109/EWDTS.2013.6673116
Filename
6673116
Link To Document