Title :
Semiconductor electronic parts testing efficiency
Author :
Oleg, Martynov ; Alexander, Ogurtsov ; Alexander, Savchenko
Author_Institution :
JSC Russian Space Syst., Russia
Abstract :
Electronic equipment reliability depends on reliability of used electronic components. Therefore it´s important to detect unreliable components during incoming inspection. This article shows results of research on efficiency of testing performed in Russian test houses. In the end some suggestions for improving testing quality are made.
Keywords :
semiconductor device reliability; semiconductor device testing; Russian test houses; electronic equipment reliability; semiconductor electronic part testing efficiency; used electronic component reliability;
Conference_Titel :
Design & Test Symposium, 2013 East-West
Conference_Location :
Rostov-on-Don
Print_ISBN :
978-1-4799-2095-2
DOI :
10.1109/EWDTS.2013.6673118
