• DocumentCode
    648533
  • Title

    Semiconductor electronic parts testing efficiency

  • Author

    Oleg, Martynov ; Alexander, Ogurtsov ; Alexander, Savchenko

  • Author_Institution
    JSC Russian Space Syst., Russia
  • fYear
    2013
  • fDate
    27-30 Sept. 2013
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    Electronic equipment reliability depends on reliability of used electronic components. Therefore it´s important to detect unreliable components during incoming inspection. This article shows results of research on efficiency of testing performed in Russian test houses. In the end some suggestions for improving testing quality are made.
  • Keywords
    semiconductor device reliability; semiconductor device testing; Russian test houses; electronic equipment reliability; semiconductor electronic part testing efficiency; used electronic component reliability;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Design & Test Symposium, 2013 East-West
  • Conference_Location
    Rostov-on-Don
  • Print_ISBN
    978-1-4799-2095-2
  • Type

    conf

  • DOI
    10.1109/EWDTS.2013.6673118
  • Filename
    6673118
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=648533