PVT variation detection and compensation methods for high-speed systems

Author

Melikyan, Vazgen ; Balabanyan, Abraham ; Durgaryan, Armen ; Stepanyan, Harutyun ; Sloyan, Karen ; Musayelyan, Hovik ; Markosyan, Gary

Author_Institution

Synopsys Armenia CJSC, Yerevan, Armenia

fYear

2013

fDate

7-9 Oct. 2013

Firstpage

322

Lastpage

327

Abstract

Methods of CMOS resistance process voltage temperature variation detection and compensation are described. Two different approaches are proposed and comparative analysis is performed. The first solution makes use of an external precise resistor as a variation reference, while the second one uses reference clock frequency for the same purpose. Detection of variations is realized using the proposed digital and analog solutions. Efficiency of the suggested methods are tested and presented for high-speed CMOS systems.

Keywords

CMOS integrated circuits; clocks; compensation; high-speed integrated circuits; reference circuits; CMOS resistance process voltage temperature variation detection; PVT variation detection; compensation methods; digital and analog solutions; high-speed CMOS systems; high-speed systems; reference clock frequency; variation reference; PVT compensation; VCO frequency; calibration; nmos; pmos; resistance variation;

fLanguage

English

Publisher

ieee

Conference_Titel

Very Large Scale Integration (VLSI-SoC), 2013 IFIP/IEEE 21st International Conference on

Conference_Location

Istanbul

Type

conf

DOI

10.1109/VLSI-SoC.2013.6673301

Filename

6673301