DocumentCode
649126
Title
Reliability assessment of combinational logic using first-order-only fanout reconvergence analysis
Author
Pagliarini, Samuel N. ; Ban, Toshinori ; Naviner, Lirida A. de B. ; Naviner, Jean-Francois
Author_Institution
Telecom ParisTech, LTCI, Inst. Mines-Telecom, France
fYear
2013
fDate
4-7 Aug. 2013
Firstpage
113
Lastpage
116
Abstract
This paper proposes two heuristic-based approaches for assessing the reliability of combinational logic in digital circuits. Both approaches take into account reconvergent signals but limited to a first-order-only analysis. Our results show that both approaches lead to more accurate results. Average estimation errors can be 63% smaller for the studied circuits.
Keywords
combinational circuits; digital circuits; integrated circuit reliability; combinational logic; digital circuits; first-order-only analysis; first-order-only fanout; heuristic-based approach; reconvergence analysis; reconvergent signals; reliability assessment;
fLanguage
English
Publisher
ieee
Conference_Titel
Circuits and Systems (MWSCAS), 2013 IEEE 56th International Midwest Symposium on
Conference_Location
Columbus, OH
ISSN
1548-3746
Type
conf
DOI
10.1109/MWSCAS.2013.6674598
Filename
6674598
Link To Document