• DocumentCode
    649128
  • Title

    Reliable ultra-low voltage cache with variation-tolerance

  • Author

    Cheng Li ; Meilin Zhang ; Ampadu, Paul

  • Author_Institution
    Univ. of Rochester, Rochester, NY, USA
  • fYear
    2013
  • fDate
    4-7 Aug. 2013
  • Firstpage
    121
  • Lastpage
    124
  • Abstract
    In this paper, an ultra-low voltage cache with improved variation-tolerance is proposed. A fast and stable adaptive mechanism, able to dynamically adjust error control strength, is designed to make the cache more resilient to supply voltage variations. Our proposed method shows a 10X improvement in residual error rate at ultra-low voltage, compared to an adaptive ECC method. It also reduces residual error rate by 3X compared to variable strength ECC method at low voltage operation and has less storage overhead.
  • Keywords
    cache storage; integrated circuit reliability; logic design; low-power electronics; adaptive ECC method; adaptive mechanism; error control strength; low voltage operation; residual error rate; storage overhead; supply voltage variations; ultra-low voltage cache; variable strength ECC method; variation-tolerance;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Circuits and Systems (MWSCAS), 2013 IEEE 56th International Midwest Symposium on
  • Conference_Location
    Columbus, OH
  • ISSN
    1548-3746
  • Type

    conf

  • DOI
    10.1109/MWSCAS.2013.6674600
  • Filename
    6674600