DocumentCode :
649128
Title :
Reliable ultra-low voltage cache with variation-tolerance
Author :
Cheng Li ; Meilin Zhang ; Ampadu, Paul
Author_Institution :
Univ. of Rochester, Rochester, NY, USA
fYear :
2013
fDate :
4-7 Aug. 2013
Firstpage :
121
Lastpage :
124
Abstract :
In this paper, an ultra-low voltage cache with improved variation-tolerance is proposed. A fast and stable adaptive mechanism, able to dynamically adjust error control strength, is designed to make the cache more resilient to supply voltage variations. Our proposed method shows a 10X improvement in residual error rate at ultra-low voltage, compared to an adaptive ECC method. It also reduces residual error rate by 3X compared to variable strength ECC method at low voltage operation and has less storage overhead.
Keywords :
cache storage; integrated circuit reliability; logic design; low-power electronics; adaptive ECC method; adaptive mechanism; error control strength; low voltage operation; residual error rate; storage overhead; supply voltage variations; ultra-low voltage cache; variable strength ECC method; variation-tolerance;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Circuits and Systems (MWSCAS), 2013 IEEE 56th International Midwest Symposium on
Conference_Location :
Columbus, OH
ISSN :
1548-3746
Type :
conf
DOI :
10.1109/MWSCAS.2013.6674600
Filename :
6674600
Link To Document :
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