DocumentCode :
649163
Title :
A Winner-Take-All circuit with improved accuracy and tolerance to mismatch and process variations
Author :
Sundararajan, Gopalakrishnan ; Winstead, Chris
Author_Institution :
Dept. of Electr. & Comput. Eng., Utah State Univ., Logan, UT, USA
fYear :
2013
fDate :
4-7 Aug. 2013
Firstpage :
265
Lastpage :
268
Abstract :
Winner-Take- All (WTA) circuit chooses a winner input from a set of input signals. WTA circuits employ transistors that operate in the sub-threshold or weak inversion region. With technology scaling, sub-threshold circuits are prone to mismatch and process variations which degrade the performance of these circuits. This paper presents a novel WTA circuit that employs a CMOS double pair transistor as a translinear element that is more tolerant to mismatch and process variations. Monte Carlo simulations are used to compare the performance of the existing and the proposed topologies to estimate the effects of process and mismatch variations. Results show that the proposed circuit is able to reduce the range of variations by three orders of magnitude compared to original one for similar variations in the transistor parameters. The proposed element also shows better accuracy in replicating the maximum input current compared to the original circuit.
Keywords :
CMOS analogue integrated circuits; MOSFET; Monte Carlo methods; CMOS double pair transistor; Monte Carlo simulations; WTA circuit; mismatch; process variations; sub-threshold region; technology scaling; translinear element; weak inversion region; winner-take-all circuit; Analog; Min-Max; Translinear; WTA;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Circuits and Systems (MWSCAS), 2013 IEEE 56th International Midwest Symposium on
Conference_Location :
Columbus, OH
ISSN :
1548-3746
Type :
conf
DOI :
10.1109/MWSCAS.2013.6674636
Filename :
6674636
Link To Document :
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