Title :
Operational current to frequency converter
Author :
Yadav, Rajat ; Raghunandan, K.R. ; Dodabalapur, Ananth ; Viswanathan, T. Lakshmi ; Viswanathan, T.R.
Author_Institution :
Dept. of Electr. & Comput. Eng., Univ. of Texas at Austin, Austin, TX, USA
Abstract :
Voltage or current-controlled oscillators with linear tuning characteristics are needed for Analog to Digital Conversion (ADC). The constant of proportionality between its input control-variable (voltage or current) and output frequency is called conversion-gain. We describe an operational current-to-frequency converter that has a large open-loop conversion-gain like in an operational transconductance element in which the input and output variables are dissimilar. The difference between a current-controlled oscillator and current to frequency converter is that the transfer characteristic of the latter passes through the origin. Such a building block is meant for use in negative feedback circuit-configurations. Here the feedback network dominates the closed-loop transfer characteristics. The ability of such a technique to trade gain for improving linearity and reducing process, voltage and temperature variations, is well known. The idea here is to provide a building block to configure ADC´s with different resolutions over a wide range of sampling rates below 1 GHz. We present the architecture of such a device and its achievable performance via simulations using the models of a typical 65nm process technology.
Keywords :
analogue-digital conversion; circuit feedback; voltage-controlled oscillators; analog to digital conversion; closed-loop transfer characteristics; current-controlled oscillators; feedback network; linear tuning characteristics; negative feedback circuit-configurations; open-loop conversion-gain; operational current to frequency converter; operational transconductance element; size 65 nm; temperature variation; voltage variation; voltage-controlled oscillators;
Conference_Titel :
Circuits and Systems (MWSCAS), 2013 IEEE 56th International Midwest Symposium on
Conference_Location :
Columbus, OH
DOI :
10.1109/MWSCAS.2013.6674795