DocumentCode :
649437
Title :
Power-efficient CMOS image acquisition system based on compressive sampling
Author :
Katic, Nikola ; Hosseini Kamal, Mahdad ; Kilic, Mustafa ; Schmid, A. ; Vandergheynst, P. ; Leblebici, Yusuf
Author_Institution :
Microelectron. Syst. Lab. (LSM), Swiss Fed. Inst. of Technol., Lausanne, Switzerland
fYear :
2013
fDate :
4-7 Aug. 2013
Firstpage :
1367
Lastpage :
1370
Abstract :
A novel compressive sampling scheme suitable for highly scalable hardware implementations is presented. The prototype design is implemented in a 0.18μm standard CMOS technology and utilizes compressed acquisition to boost the overall power efficiency. Specialized pixels, convenient for Comparator-Based Switched Capacitor readout are developed for this purpose. A custom measurement matrix generation algorithm is implemented which reduces in-pixel hardware complexity and performs measurement matrix generation in a single clock cycle. Column-Parallel Differential Cyclic-ADCs based on the Zero-Crossing Detection (ZCD) technique are used to convert the analog image measurements. Physical IC design issues such as the device noise, mismatch and non-linearity, are analyzed and their effects on compressed image acquisition are discussed. The final simulation results show that the proposed 256×256 pixels architecture consumes 1.45mW at 250fps and 26.2mW at 8000fps. The architecture can easily be scaled towards newer technology nodes and higher image resolutions.
Keywords :
CMOS image sensors; analogue-digital conversion; comparators (circuits); compressed sensing; integrated circuit design; switched capacitor networks; CMOS image acquisition system; CMOS image sensor; ZCD technique; analog image measurements; column-parallel differential cyclic-ADCs; comparator-based switched capacitor readout; compressed acquisition; compressed image acquisition; compressive sampling; custom measurement matrix generation algorithm; device noise; in-pixel hardware complexity reduction; physical IC design; power 1.45 mW; power 26.2 mW; power efficiency; prototype design; single clock cycle; size 0.18 mum; specialized pixels; zero-crossing detection technique; CMOS integrated circuits; Capacitors; Charge transfer; Hardware; Image coding; Image reconstruction; Noise; CMOS Image Sensor; Compressive Sampling; Cyclic ADC; High Frame Rate; Image Acquisition; Low-Power;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Circuits and Systems (MWSCAS), 2013 IEEE 56th International Midwest Symposium on
Conference_Location :
Columbus, OH
ISSN :
1548-3746
Type :
conf
DOI :
10.1109/MWSCAS.2013.6674910
Filename :
6674910
Link To Document :
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