DocumentCode :
64963
Title :
Terahertz Photoacoustic Spectroscopy Using an MEMS Cantilever Sensor
Author :
Glauvitz, Nathan E. ; Coutu, Ronald A. ; Medvedev, Ivan R. ; Petkie, Douglas T.
Author_Institution :
Air Force Inst. of Technol., Wright-Patterson AFB, OH, USA
Volume :
24
Issue :
1
fYear :
2015
fDate :
Feb. 2015
Firstpage :
216
Lastpage :
223
Abstract :
In this paper, a microelectromechanical systems cantilever sensor was designed, modeled, and fabricated to measure the photoacoustic (PA) response of gases under very low vacuum conditions. The micromachined devices were fabricated using silicon-on-insulator wafers and then tested in a custom-built, miniature, vacuum chamber during this first-ever demonstration. Terahertz radiation was amplitude modulated to excite the gas under test and perform PA molecular spectroscopy. Experimental data show a predominantly linear response that directly correlates measured cantilever deflection to PA signals. Excellent low pressure (i.e., 2-40 mTorr) methyl cyanide PA spectral data were collected resulting in a system sensitivity of 1.97 × 10-5 cm-1 and a normalized noise equivalent absorption coefficient of 1.39 × 10-9 cm-1 W Hz-1/2.
Keywords :
acoustic measurement; amplitude modulation; cantilevers; chemical sensors; mechanical variables measurement; microfabrication; microsensors; photoacoustic spectroscopy; silicon-on-insulator; terahertz spectroscopy; MEMS cantilever sensor; PA molecular spectroscopy; PA signals; amplitude modulation; cantilever deflection measurement; custom built chamber; methyl cyanide PA spectral data collection; microelectromechanical systems; micromachined device fabrication; normalized noise equivalent absorption coefficient; photoacoustic response measurement; predominantly linear response; silicon-on-insulator wafers; system sensitivity; terahertz photoacoustic spectroscopy; vacuum chamber; Absorption; Damping; Frequency modulation; Laser beams; Resonant frequency; Spectroscopy; Microelectromechanical systems (MEMS); cantilever; photoacoustic; spectroscopy; spectroscopy.; terahertz;
fLanguage :
English
Journal_Title :
Microelectromechanical Systems, Journal of
Publisher :
ieee
ISSN :
1057-7157
Type :
jour
DOI :
10.1109/JMEMS.2014.2327916
Filename :
6841602
Link To Document :
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