• DocumentCode
    64963
  • Title

    Terahertz Photoacoustic Spectroscopy Using an MEMS Cantilever Sensor

  • Author

    Glauvitz, Nathan E. ; Coutu, Ronald A. ; Medvedev, Ivan R. ; Petkie, Douglas T.

  • Author_Institution
    Air Force Inst. of Technol., Wright-Patterson AFB, OH, USA
  • Volume
    24
  • Issue
    1
  • fYear
    2015
  • fDate
    Feb. 2015
  • Firstpage
    216
  • Lastpage
    223
  • Abstract
    In this paper, a microelectromechanical systems cantilever sensor was designed, modeled, and fabricated to measure the photoacoustic (PA) response of gases under very low vacuum conditions. The micromachined devices were fabricated using silicon-on-insulator wafers and then tested in a custom-built, miniature, vacuum chamber during this first-ever demonstration. Terahertz radiation was amplitude modulated to excite the gas under test and perform PA molecular spectroscopy. Experimental data show a predominantly linear response that directly correlates measured cantilever deflection to PA signals. Excellent low pressure (i.e., 2-40 mTorr) methyl cyanide PA spectral data were collected resulting in a system sensitivity of 1.97 × 10-5 cm-1 and a normalized noise equivalent absorption coefficient of 1.39 × 10-9 cm-1 W Hz-1/2.
  • Keywords
    acoustic measurement; amplitude modulation; cantilevers; chemical sensors; mechanical variables measurement; microfabrication; microsensors; photoacoustic spectroscopy; silicon-on-insulator; terahertz spectroscopy; MEMS cantilever sensor; PA molecular spectroscopy; PA signals; amplitude modulation; cantilever deflection measurement; custom built chamber; methyl cyanide PA spectral data collection; microelectromechanical systems; micromachined device fabrication; normalized noise equivalent absorption coefficient; photoacoustic response measurement; predominantly linear response; silicon-on-insulator wafers; system sensitivity; terahertz photoacoustic spectroscopy; vacuum chamber; Absorption; Damping; Frequency modulation; Laser beams; Resonant frequency; Spectroscopy; Microelectromechanical systems (MEMS); cantilever; photoacoustic; spectroscopy; spectroscopy.; terahertz;
  • fLanguage
    English
  • Journal_Title
    Microelectromechanical Systems, Journal of
  • Publisher
    ieee
  • ISSN
    1057-7157
  • Type

    jour

  • DOI
    10.1109/JMEMS.2014.2327916
  • Filename
    6841602