• DocumentCode
    65010
  • Title

    First call for papers: IEEE International Integrated Reliability Workshop

  • Volume
    60
  • Issue
    6
  • fYear
    2013
  • fDate
    Jun-13
  • Firstpage
    2092
  • Lastpage
    2092
  • Abstract
    The IEEE International Integrated Reliability Workshop (IIRW) focuses on ensuring electronic device reliability through fabrication, design, testing, characterization, and simulation, as well as identification of the defects and physical mechanisms responsible for reliability problems. Submit your two-page abstract by 12 July 2013 to be part of this unique event. For further information visit http://www.iirw.org or contact the TPC chair.
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/TED.2013.2263743
  • Filename
    6516968
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=65010