Title :
Equivalent fading statistics in the K fading channels
Author :
Kun Xiao ; Yi Zhang ; Xiansong Lu
Author_Institution :
Sch. of Electron. & Eng., Guangxi Normal Univ., Guilin, China
Abstract :
In order to obtain the fading statistics for the K fading channels, the equivalent process of the K process, i.e. the product process of a Rayleigh process and a Nakagami process, is utilized. The mapping relationship between the K process and its equivalent process is found by equating the arbitrary order moments of them. On this basis, the equivalent level crossing rate (LCR) of the K fading channels is derived first and followed by the derivations of the equivalent average fade duration (AFD). Also, the fading statistics of the K fading channels at low signal levels are given because the communications under the fragile radio link are very important for us to study. Finally, the numerical computations and analysis are presented.
Keywords :
Nakagami channels; Rayleigh channels; fading channels; numerical analysis; AFD; K fading channels; LCR; Nakagami process; Rayleigh process; average fade duration; equivalent fading statistics; equivalent process; fading statistics; level crossing rate; mapping relationship; numerical computations; radio link; K fading channels; average fade duration; level crossing rate;
Conference_Titel :
Wireless and Optical Communication Conference (WOCC), 2013 22nd
Conference_Location :
Chongqing
Print_ISBN :
978-1-4673-5697-8
DOI :
10.1109/WOCC.2013.6676370