• DocumentCode
    65228
  • Title

    Assessing Risk of a Serious Failure Mode Based on Limited Field Data

  • Author

    Zhibing Xu ; Yili Hong ; Meeker, William Q.

  • Author_Institution
    Dept. of Stat., Virginia Polytech. Inst. & State Univ., Blacksburg, VA, USA
  • Volume
    64
  • Issue
    1
  • fYear
    2015
  • fDate
    Mar-15
  • Firstpage
    51
  • Lastpage
    62
  • Abstract
    Many consumer products are designed and manufactured so that the probability of failure during the technological life of the product is small. Most product units in the field retire before they fail. Even though the number of failures of such products is small, there is still a need to model and predict field failures for purposes of risk assessment in applications that involve safety. Challenges in the modeling and prediction of failures arise because the retirement times are often unknown, few failures have been reported, and there are delays in field failure reporting. Motivated by an application to assess the risk of failure for a particular product, we develop a statistical prediction procedure that considers the impact of product retirements and reporting delays. Based on the developed method, we provide the point predictions for the cumulative number of reported failures over a future time period, and corresponding prediction intervals to quantify uncertainty. We also conduct sensitivity analysis to assess the effects of different assumptions on failure-time and retirement distributions.
  • Keywords
    consumer products; failure analysis; probability; reliability; risk management; sensitivity analysis; consumer product; failure mode; failure-time; field failure reporting; limited field data; probability; product retirement; reporting delay; retirement distribution; risk assessment; sensitivity analysis; statistical prediction procedure; technological life; Delays; Maximum likelihood estimation; Probability density function; Retirement; Shape; Standards; Weibull distribution; Calibration; Poisson-binomial distribution; Weibull; discrete Fourier transform; failure reporting delay; prediction interval;
  • fLanguage
    English
  • Journal_Title
    Reliability, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9529
  • Type

    jour

  • DOI
    10.1109/TR.2014.2354893
  • Filename
    6895318