DocumentCode
653569
Title
Energy spectrum-based wavelet transform for non-intrusive demand monitoring and load identification
Author
Hsueh-Hsien Chang ; Kuo-Lung Lian ; Yi-Ching Su ; Wei-Jen Lee
Author_Institution
Jin Wen Univ. of Sci. & Technol., New Taipei, Taiwan
fYear
2013
fDate
6-11 Oct. 2013
Firstpage
1
Lastpage
9
Abstract
Though the wavelet transform coefficients (WTCs) contain plenty of information needed for turn-on/off transient signal identification of load events, adopting the WTCs directly has the drawbacks of taking a longer time and much memory for the identification process of non-intrusive load monitoring (NILM). To effectively reduce the number of features representing load turn-on/off transient signals, an energy spectrum of the WTCs in different scales calculated by the Parseval´s Theorem are proposed and presented in this paper. The back-propagation (BP) classification system is then used for artificial neural network (ANN) constructions and load identifications. The high successful rates of load events recognition from both experiments and simulations have proved that the proposed algorithm is applicable in multiple load operations of non-intrusive demand monitoring applications.
Keywords
backpropagation; computerised monitoring; demand side management; neural nets; power engineering computing; transient analysis; wavelet transforms; ANN; BP classification system; Parseval theorem; WTC; artificial neural network; backpropagation classification system; energy spectrum; energy spectrum-based wavelet transform coefficient; load identification; nonintrusive demand monitoring; nonintrusive load monitoring; turn-on-off transient signal identification; Artificial neural networks; Energy efficiency; Home appliances; Induction motors; Rectifiers; Variable speed drives; Wavelet transforms; Artificial neural networks (ANNs); Parseval´s Theorem; load identification; non-intrusive load monitoring (NILM); wavelet transform;
fLanguage
English
Publisher
ieee
Conference_Titel
Industry Applications Society Annual Meeting, 2013 IEEE
Conference_Location
Lake Buena Vista, FL
ISSN
0197-2618
Type
conf
DOI
10.1109/IAS.2013.6682478
Filename
6682478
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