• DocumentCode
    653613
  • Title

    Oil filled bushing secrets revealed

  • Author

    Goff, Mark B. ; Eltom, A.H.

  • fYear
    2013
  • fDate
    6-11 Oct. 2013
  • Firstpage
    1
  • Lastpage
    9
  • Abstract
    Bushings provide a point of interface such that electrical current can pass to and from an electrical apparatus. Much like bridges on the highway, bushings are very critical and are the weakest link on any high voltage electrical apparatus such as power transformers, circuit breakers or instrument transformers. The integrate design and high areas of stress of bushings makes electrical testing, visual inspection and infrared inspection a vital part of any maintenance program. This paper describes the two elements of stress on bushings and breaks down a bushing into first principle components. Next, this paper details how portable test equipment can be used to examine these basic components of a bushing and gives guidelines for acceptance criteria. By understanding the basic construction of a bushing and applying testing methodologies of power factor, resistance, infrared inspection, and dissolved gas-in-oil, a good test and maintenance program can be established.
  • Keywords
    bushings; inspection; machine testing; maintenance engineering; test equipment; acceptance criteria; circuit breakers; dissolved gas-in-oil testing; electrical current; electrical testing; first principle components; high voltage electrical apparatus; infrared inspection; instrument transformers; maintenance program; oil filled bushing; portable test equipment; power factor testing; power transformers; resistance testing; testing methodologies; visual inspection; Electric potential; Oil drilling; Oil insulation; Power transformer insulation; Micro-Ohm Meter; Transformer Ohm Meter; bushing dissolved gas-in-oil analysis; bushings; dissipation factor testing; electrical equipment; power factor testing; temperature limits; temperature profiles;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Industry Applications Society Annual Meeting, 2013 IEEE
  • Conference_Location
    Lake Buena Vista, FL
  • ISSN
    0197-2618
  • Type

    conf

  • DOI
    10.1109/IAS.2013.6682522
  • Filename
    6682522