• DocumentCode
    653635
  • Title

    New technique for embedding depth information in captured images using light containing invisible high-frequency patterns

  • Author

    Unno, Hiroshi ; Isaka, Sae ; Uehira, Kazutake

  • Author_Institution
    Kanagawa Inst. of Technol., Atsugi, Japan
  • fYear
    2013
  • fDate
    6-11 Oct. 2013
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    We present a new technique for capturing images where depth information on an object is invisibly and simultaneously embedded in its 2-D image when its image is taken with a camera. An object is illuminated by light that contains invisible patterns whose characteristics change depending on depth; therefore, the images of objects captured with the camera also invisibly contain their depth information. This invisible information on depth can be extracted by appropriate image processing from the captured images. Images taken with this technique can be treated as conventional 2-D images because the image format is for conventional 2-D images. 3-D images can be constructed by abstracting depth information embedded in the images. We carried out experiments using periodical patterns whose pattern pitch were under the revolving power of human vision and whose spatial frequency changed depending on depth. We demonstrated that the depth map on a captured image could be produced by obtaining the frequency of the periodical pattern in the image using a discreet Fourier transform.
  • Keywords
    Fourier transform optics; cameras; image capture; image processing; vision; 2D images; 3D images; camera; discreet Fourier transform; embedded depth information; human vision; image capture; image format; image processing; invisible high-frequency patterns; pattern pitch; periodical patterns; spatial frequency; Discrete Fourier transforms; Image processing; Transform coding; 3-D image; depth map; information hiding;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Industry Applications Society Annual Meeting, 2013 IEEE
  • Conference_Location
    Lake Buena Vista, FL
  • ISSN
    0197-2618
  • Type

    conf

  • DOI
    10.1109/IAS.2013.6682544
  • Filename
    6682544