• DocumentCode
    65442
  • Title

    {\\rm MoS}_{2} Field-Effect Transistors With Graphene/Metal Heterocontacts

  • Author

    Yuchen Du ; Lingming Yang ; Jingyun Zhang ; Han Liu ; Majumdar, Kausik ; Kirsch, Paul D. ; Ye, Peide D.

  • Author_Institution
    Birck Nanotechnol. Center, Purdue Univ., West Lafayette, IN, USA
  • Volume
    35
  • Issue
    5
  • fYear
    2014
  • fDate
    May-14
  • Firstpage
    599
  • Lastpage
    601
  • Abstract
    For the first time, n-type few-layer MoS2 field-effect transistors (FETs) with graphene/Ti as the heterocontacts have been fabricated, showing more than 160-mA/mm drain current at 1-μm gate length with an ON-OFF current ratio of 107. The enhanced electrical characteristic is confirmed in a nearly 2.1 times improvement in ON-resistance and a 3.3 times improvement in contact resistance with heterocontacts compared with the MoS2 FETs without graphene contact layer. Temperature-dependent study on MoS2/graphene heterocontacts has been also performed, still unveiling its Schottky contact nature. Transfer length method and a devised I-V method have been introduced to study the contact resistance and Schottky barrier height in MoS2/graphene/metal heterocontacts structure.
  • Keywords
    Schottky barriers; contact resistance; field effect transistors; graphene; molybdenum compounds; titanium; FET; MoS2; ON-OFF current ratio; ON-resistance; Schottky barrier height; Schottky contact nature; Ti; contact resistance; devised I-V method; electrical characteristic enhancement; graphene-metal heterocontacts structure; n-type few-layer field-effect transistors; size 1 mum; temperature-dependent study; transfer length method; Contact resistance; Field effect transistors; Graphene; Metals; Schottky barriers; Temperature measurement; ${rm MoS}_{2}$; MOSFET; MoS₂; Schottky barrier height; Schottky barrier height.; graphene; heterocontacts;
  • fLanguage
    English
  • Journal_Title
    Electron Device Letters, IEEE
  • Publisher
    ieee
  • ISSN
    0741-3106
  • Type

    jour

  • DOI
    10.1109/LED.2014.2313340
  • Filename
    6783768