DocumentCode
655200
Title
Strong LTCs with Inverse Poly-Log Rate and Constant Soundness
Author
Viderman, Michael
Author_Institution
Comput. Sci. Dept., Technion - Israel Inst. of Technol., Haifa, Israel
fYear
2013
fDate
26-29 Oct. 2013
Firstpage
330
Lastpage
339
Abstract
An error-correcting code C is called (q, ϵ)-strong locally testable code (LTC) if there exists a tester that makes at most q queries to the input word. This tester accepts all code words with probability 1 and rejects all non-code words x with probability at least ϵ · δ(x, C), where δ(x, C) denotes the relative Hamming distance between the word x and the code C. The parameter q is called the query complexity and the parameter ϵ is called soundness. In this paper we resolve an open question raised by Gold Reich and Sudan (J. ACM 2006) and construct binary linear strong LTCs with query complexity 3, constant relative distance, constant soundness and inverse polylogarithmic rate. Our result is based on the previous paper of the author (Vide man, ECCC TR12-168), which presented binary linear strong LTCs with query complexity 3, constant relative distance, and inverse polylogarithmic soundness and rate. We show that the "gap amplification" procedure of Dinur (J. ACM 2007) can be used to amplify the soundness of these strong LTCs from inverse polylogarithmic up to a constant, while preserving the other parameters of these codes. Furthermore, we show that under a conceivable conjecture, there exist asymptotically good strong LTCs with poly-log query complexity.
Keywords
Hamming codes; binary codes; computational complexity; error correction codes; linear codes; probability; query processing; theorem proving; Hamming distance; binary linear strong LTC; code words; constant relative distance; constant soundness; error-correcting code C; gap amplification; inverse poly-log rate; inverse polylogarithmic rate; inverse polylogarithmic soundness; locally testable code; poly-log query complexity; probability; Complexity theory; Computer science; Error correction codes; Hamming distance; Linear codes; Parity check codes; Probabilistic logic; PCPs; error-correcting codes; locally testable codes;
fLanguage
English
Publisher
ieee
Conference_Titel
Foundations of Computer Science (FOCS), 2013 IEEE 54th Annual Symposium on
Conference_Location
Berkeley, CA
ISSN
0272-5428
Type
conf
DOI
10.1109/FOCS.2013.43
Filename
6686169
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