DocumentCode
655225
Title
Arithmetic Circuits: A Chasm at Depth Three
Author
Gupta, Arpan ; Kamath, Pritish ; Kayal, Neeraj ; Saptharishi, Ramprasad
Author_Institution
Microsoft Res. India, India
fYear
2013
fDate
26-29 Oct. 2013
Firstpage
578
Lastpage
587
Abstract
We show that, over Q, if an n-variate polynomial of degree d = nO(1) is computable by an arithmetic circuit of size s (respectively by an arithmetic branching program of size s) then it can also be computed by a depth three circuit (i.e. a ΣΠΣ-circuit) of size exp(O(√(d log n log d log s))) (respectively of size exp(O(√(d log n log s))). In particular this yields a ΣΠΣ circuit of size exp(O(√(d log d))) computing the d × d determinant Detd. It also means that if we can prove a lower bound of exp(omega(√(d log d))) on the size of any ΣΠΣ-circuit computing the d × d permanent Permd then we get super polynomial lower bounds for the size of any arithmetic branching program computing Permd. We then give some further results pertaining to derandomizing polynomial identity testing and circuit lower bounds. The ΣΠΣ circuits that we construct have the property that (some of) the intermediate polynomials have degree much higher than d. Indeed such a counterintuitive construction is unavoidable - it is known that in any ΣΠΣ circuit C computing either Detd or Perm_d, if every multiplication gate has fanin at most d (or any constant multiple thereof) then C must have size at least exp(Ω(d)).
Keywords
circuit complexity; digital arithmetic; polynomials; ΣΠΣ-circuit computing; arithmetic branching program computing; arithmetic circuits; circuit lower bounds; counterintuitive construction; depth three circuit; derandomizing polynomial identity testing; n-variate polynomial; super polynomial lower bounds; Complexity theory; Computer science; Logic gates; Polynomials; Tensile stress; Testing; VNP; VP; arithmetic circuits; depth reduction; depth three circuits; determinant; permanent;
fLanguage
English
Publisher
ieee
Conference_Titel
Foundations of Computer Science (FOCS), 2013 IEEE 54th Annual Symposium on
Conference_Location
Berkeley, CA
ISSN
0272-5428
Type
conf
DOI
10.1109/FOCS.2013.68
Filename
6686194
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