DocumentCode :
655530
Title :
A refined 3D Markov model for non-saturated IEEE 802.11 DCF netwoks
Author :
Martorell, Gabriel ; Femenias, Guillem ; Riera-Palou, Felip
Author_Institution :
Mobile Commun. Group, Univ. of the Balearic Islands, Palma de Mallorca, Spain
fYear :
2013
fDate :
13-15 Nov. 2013
Firstpage :
1
Lastpage :
8
Abstract :
This paper proposes a novel analytical model to evaluate the system performance of the IEEE 802.11 MAC sublayer under both light and heavy traffic loads. This approach, based on a three-dimensional Markov chain, generalizes the bi-dimensional Markov chain models introduced in the literature. Traditional bi-dimensional Markov chain models, while suitable for throughput analysis, are unable to capture QoS performance metrics such as the average packet delay, the average queue length and the blocking and discard probabilities due to the lack of a proper queueing model. We present a refined three-dimensional Markov chain approach that incorporates a queueing model and error prone channel effects. The Markov chain is efficiently solved by using our refined Collapsed Transition onto Basis approach, allowing the investigation of the whole set of QoS metrics for an IEEE 802.11 network under realistic conditions. The model is validated by contrasting the predicted metrics with extensive numerical simulations as well as with results obtained using previously available analytical methods.
Keywords :
Markov processes; access protocols; probability; quality of service; queueing theory; wireless LAN; IEEE 802.11 MAC sublayer; QoS metrics; QoS performance metrics; average packet delay; average queue length; bi-dimensional Markov chain models; blocking probabilities; discard probabilities; distributed coordination function; error prone channel effects; nonsaturated IEEE 802.11 DCF netwoks; novel analytical model; queueing model; refined 3D Markov model; refined collapsed transition; refined three-dimensional Markov chain approach; system performance; Analytical models; Delays; IEEE 802.11 Standards; Markov processes; Radiation detectors; Solid modeling; Three-dimensional displays;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Wireless Days (WD), 2013 IFIP
Conference_Location :
Valencia
ISSN :
2156-9711
Type :
conf
DOI :
10.1109/WD.2013.6686534
Filename :
6686534
Link To Document :
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