• DocumentCode
    65562
  • Title

    Controlling Self-Force for Unstructured Particle-in-Cell (PIC) Codes

  • Author

    Bettencourt, Matthew T.

  • Author_Institution
    Sandia Nat. Labs., Albuquerque, NM, USA
  • Volume
    42
  • Issue
    5
  • fYear
    2014
  • fDate
    May-14
  • Firstpage
    1189
  • Lastpage
    1194
  • Abstract
    A new algorithm was developed, which reduces the self-force in particle-in-cell codes on unstructured meshes in a predictable and controllable way. This is accomplished by computing a charge density weighting function for a particle, which reproduces the Green´s function solution to Poisson´s equation at nodes when using a standard finite element method methodology. This provides a superior local potential and allows for particle-particle particle-mesh techniques to be used to subtract off local force contributions, including fictitious self-forces resulting in accurate long-range forces on a particle and improved local Coulomb collisions. Local physical forces are then computed using the Green´s function on local particle pairs and added to the long-range forces. Results were shown with up to five orders reduction in self-force and superior intraparticle forces for two test cases.
  • Keywords
    Green´s function methods; Poisson equation; finite element analysis; plasma collision processes; plasma density; plasma kinetic theory; plasma simulation; Green´s function solution; PIC code; Poisson equation; charge density weighting function; improved local Coulomb collisions; intraparticle force; local force contribution; local particle pairs; local physical force; long-range force; particle-particle particle-mesh technique; self-force algorithm; standard finite element method; unstructured meshes; unstructured particle-in-cell codes; Approximation methods; Electric potential; Equations; Force; Green´s function methods; Laplace equations; Standards; Computational modeling; computer simulation; plasma applications; plasma materials processing; plasma simulation; plasma simulation.;
  • fLanguage
    English
  • Journal_Title
    Plasma Science, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0093-3813
  • Type

    jour

  • DOI
    10.1109/TPS.2014.2313515
  • Filename
    6783778