DocumentCode
655646
Title
Microwave characterization of low volume materials in the ISM band
Author
Jamal, Rammal ; Olivier, Tantot ; Nicolas, Delhote ; Serge, Verdeyme ; Michel, A.
Author_Institution
XLIM, Univ. of Limoges, Limoges, France
fYear
2013
fDate
6-10 Oct. 2013
Firstpage
322
Lastpage
325
Abstract
We describe a near field microwave microscopy method for characterization and rapid non-destructive imaging of dielectric materials samples at 2.45 GHz. This system is composed of a probe coupled to a dielectric resonator. It is used for two purposes: first to characterize dielectric samples with accuracy and high spatial resolution, knowing that they do not have predetermined forms but a small plane surface; and second, to draw dielectric cartographies for flat samples, with a 100 μm resolution.
Keywords
dielectric materials; dielectric resonators; microwave imaging; nondestructive testing; ISM band; dielectric material; dielectric resonator; frequency 2.45 GHz; low volume material; microwave characterization; near field microwave microscopy method; rapid nondestructive imaging; Dielectric measurement; Dielectrics; Microwave imaging; Microwave theory and techniques; Permittivity; Probes; Resonant frequency; dielectric constant; dielectric material; dielectric resonator; matrial characterization; near field microscopy;
fLanguage
English
Publisher
ieee
Conference_Titel
Microwave Conference (EuMC), 2013 European
Conference_Location
Nuremberg
Type
conf
Filename
6686656
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