Title :
On high resolution, pulse-profiled mm-wave intermodulation measurements
Author_Institution :
Anritsu Co., Morgan Hill, CA, USA
Abstract :
Distortion measurements in mm-wave systems are becoming increasingly important including in situations with pulsed or related signals. Of particular interest are edge-related phenomena including nonlinearities induced by drive overshoot and ringing and those whose behaviors are convolved with longer time constant mechanisms (e.g., thermal). Complications, calibration methods, potential uncertainties, and resolution-offset tradeoffs associated with this measurement class will be discussed in the context of W-band and D-band amplifier measurements emphasizing edge-related IMD behavior.
Keywords :
amplifiers; calibration; distortion measurement; intermodulation distortion; intermodulation measurement; millimetre wave measurement; D-band amplifier measurement; W-band amplifier measurement; calibration method; distortion measurement; edge-related IMD behavior; pulse-profiled mm-wave intermodulation measurement; resolution-offset tradeoff; time constant mechanism; Calibration; Frequency measurement; Modulation; Pollution measurement; Power measurement; Pulse measurements; Receivers; intermodulation distortion; mm-wave; network analyzer; nonlinearity; pulse profile;
Conference_Titel :
Microwave Conference (EuMC), 2013 European
Conference_Location :
Nuremberg
