DocumentCode :
655923
Title :
Liquid crystal and Infrared Thermography on coated SAW devices
Author :
Huck, C. ; Zidek, H.P. ; Ebner, Thomas ; Wagner, K.C. ; Wixforth, Achim
Author_Institution :
Inst. of Phys., Univ. of Augsburg, Augsburg, Germany
fYear :
2013
fDate :
6-10 Oct. 2013
Firstpage :
1423
Lastpage :
1426
Abstract :
Reliability of micro-electronic devices is one of the most important issues in mobile communication systems and is significantly influenced by the thermal behavior of the components. The present contribution demonstrates Liquid Crystal Thermography (LCT) and Infrared Thermography (IRT) in exemplary investigations of self-heating effects in a half-section ladder-type Surface Acoustic Wave (SAW) filter with thick SiO2 coating. Conventionally, mean temperature values are obtained indirectly by evaluating measured frequency shifts under load using the Temperature Coefficient of Frequency (TCF). In contrast to TCF based evaluations, LCT and IRT provide spatially resolved measurements of the temperature distribution on the component and serve as an independent and direct scheme for thermal characterizations. The results of LCT and IRT measurements are compared with simulations of the temperature distribution and show good agreement.
Keywords :
coating techniques; infrared imaging; integrated circuit reliability; ladder filters; liquid crystals; mobile communication; silicon compounds; surface acoustic wave filters; temperature distribution; temperature measurement; thin film sensors; IRT; LCT; SiO2; TCF based evaluation; coated SAW device; infrared thermography; ladder type SAW filter; liquid crystal thermography; measured frequency shift evaluation; microelectronic device reliability; mobile communication system; self-heating effect; surface acoustic wave; temperature coefficient of frequency; temperature distribution measurement; thermal characterizations; thick SiO2 coating; Calibration; Frequency measurement; Liquid crystals; Semiconductor device measurement; Surface treatment; Temperature distribution; Temperature measurement;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Microwave Conference (EuMC), 2013 European
Conference_Location :
Nuremberg
Type :
conf
Filename :
6686934
Link To Document :
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