DocumentCode :
656578
Title :
Characterization of a DC to 40 GHz SPDT switch based on GaAs mHEMT technology at cryogenic temperature
Author :
Baldischweiler, Boris ; Bruch, Daniel ; Kallfass, I. ; Seelmann-Eggebert, Matthias ; Leuther, A. ; Peschel, Detlef ; Schlechtweg, Michael ; Ambacher, Oliver
Author_Institution :
Fraunhofer Inst. for Appl. Solid State Phys., Freiburg, Germany
fYear :
2013
fDate :
6-8 Oct. 2013
Firstpage :
141
Lastpage :
144
Abstract :
In this paper a DC to 40 GHz single pole double throw (SPDT) switch based on GaAs metamorphic high electron-mobility transistors (mHEMTs) is presented. Characterization is carried out at ambient temperature and at 15 K. The insertion loss from DC to 40 GHz is smaller than 2.2 dB and 1.5 dB at 295 K and 15 K, respectively. The isolation is better than 17 dB. The switch with a size of 1 × 1 mm2 is dedicated to multi-purpose measurement setups at cryogenic temperature, but also operates at room temperature. Bias dependency, switch design and influence of illumination are discussed additionally.
Keywords :
III-V semiconductors; field effect transistor switches; gallium arsenide; microwave switches; GaAs; SPDT switch characterization; bias dependency; cryogenic temperature; frequency 0 GHz to 40 GHz; illumination; mHEMT technology; metamorphic high electronmobility transistors; multipurpose measurement setups; single pole double throw switch; switch design; temperature 15 K; temperature 293 K to 298 K; Cryogenics; Insertion loss; Lighting; Switches; Switching circuits; Transistors; GaAs; MMIC; SPDT switch; cryogenic; low loss; mHEMT;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Microwave Integrated Circuits Conference (EuMIC), 2013 European
Conference_Location :
Nuremberg
Type :
conf
Filename :
6687805
Link To Document :
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