DocumentCode :
656640
Title :
On high resolution, pulse-profiled mm-wave intermodulation measurements
Author :
Martens, J.
Author_Institution :
Anritsu Co., Morgan Hill, CA, USA
fYear :
2013
fDate :
6-8 Oct. 2013
Firstpage :
392
Lastpage :
395
Abstract :
Distortion measurements in mm-wave systems are becoming increasingly important including in situations with pulsed or related signals. Of particular interest are edge-related phenomena including nonlinearities induced by drive overshoot and ringing and those whose behaviors are convolved with longer time constant mechanisms (e.g., thermal). Complications, calibration methods, potential uncertainties, and resolution-offset tradeoffs associated with this measurement class will be discussed in the context of W-band and D-band amplifier measurements emphasizing edge-related IMD behavior.
Keywords :
intermodulation distortion; intermodulation measurement; millimetre wave amplifiers; D-band amplifier measurement; W-band amplifier measurements; calibration method; distortion measurement; drive overshoot; edge-related IMD behavior; edge-related phenomena; mm-wave systems; potential uncertainties; pulse-profiled mm-wave intermodulation measurement; pulsed signal; related signal; resolution-offset tradeoff; ringing; time constant mechanism; Calibration; Frequency measurement; Modulation; Pollution measurement; Power measurement; Pulse measurements; Receivers; intermodulation distortion; mm-wave; network analyzer; nonlinearity; pulse profile;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Microwave Integrated Circuits Conference (EuMIC), 2013 European
Conference_Location :
Nuremberg
Type :
conf
Filename :
6687868
Link To Document :
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