DocumentCode :
656647
Title :
Class-BJ power amplifier modes: The IMD behavior of reactive terminations
Author :
Carrubba, V. ; Maroldt, S. ; Quay, Ruediger ; Ambacher, Oliver
Author_Institution :
High Freq. Devices &Circuits, Fraunhofer Inst. for Appl. Solid State Phys. (IAF), Freiburg, Germany
fYear :
2013
fDate :
6-8 Oct. 2013
Firstpage :
420
Lastpage :
423
Abstract :
For the first time a two-tone intermodulation distortion behavior for the class-BJ power amplifier mode is studied. The right phase combination of fundamental and second harmonic terminations lead to new output solutions where the power-efficiency is maintained optimum. However, no IMD behavior has so far been investigated for such terminations on a power transistor through load-pull investigation. In this paper, the class-BJ IMD analysis is investigated theoretically and experimentally through measurement activity on a 1.2 mm AlGaN/GaN power transistor under a two-tone excitation. The measurement results show that the standard class-B and reactive class-BJ solutions deliver same power-efficiency as well as same IM3 performance when driving the device into compression. However, when driving the device at 6 dB input power back-off, despite power and efficiency are similar with varying the terminations, the standard class-B state reveals better IM3 values of -40.5 dBc compared with the class-BJ solution of -31.8 dBc.
Keywords :
intermodulation; power amplifiers; IM3 performance; IMD behavior; class BJ IMD analysis; class BJ power amplifier modes; intermodulation distortion behavior; load pull; measurement activity; phase combination; power efficiency; power transistor; reactive class BJ solutions; reactive terminations; second harmonic terminations; standard class B solutions; standard class B state; two-tone excitation; Harmonic analysis; Performance evaluation; Power amplifiers; Power generation; Power measurement; Power transistors; Standards; Aluminum gallium nitride; broadband amplifiers; intermodulation distortion; linearity; power amplifiers;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Microwave Integrated Circuits Conference (EuMIC), 2013 European
Conference_Location :
Nuremberg
Type :
conf
Filename :
6687875
Link To Document :
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