DocumentCode :
656899
Title :
MEMS disk resonator gyroscope with integrated analog front-end
Author :
Su, T.-H. ; Nitzan, Sarah ; Taheri-Tehrani, P. ; Kline, Mitchell ; Boser, Bernhard ; Horsley, David A.
Author_Institution :
Electr. & Comput. Eng., Univ. of California, Davis, Davis, CA, USA
fYear :
2013
fDate :
3-6 Nov. 2013
Firstpage :
1
Lastpage :
4
Abstract :
We present a 2 mm diameter, 35 μm thick disk resonator gyro (DRG) fabricated in <;111> silicon with integrated 0.35 μm CMOS analog front-end circuits in the Invensense NF process. This process incorporates a wafer-level vacuum seal, yielding a quality factor (Q) of 2800 at the DRG´s 78 kHz resonance frequency. After performing electrostatic tuning to enable mode-matched operation, this DRG achieves a 63 μV/°/s sensitivity. Resonator vibration in the sense and drive axes is sensed using capacitive transduction, and amplified using a low-noise, on-chip integrated circuit. This allows the DRG to achieve Brownian noise-limited performance. The angle random walk (ARW) is measured to be 0.01 (*/sec)/√Hz and the bias instability is 30 °/hr.
Keywords :
CMOS analogue integrated circuits; Q-factor; circuit stability; gyroscopes; micromechanical resonators; vibrations; ARW; Brownian noise-limited performance; CMOS analog front-end circuits; DRG; MEMS disk resonator gyroscope; angle random walk; bias instability; capacitive transduction; electrostatic tuning; frequency 78 kHz; integrated analog front-end; invensense NF process; mode-matched operation; on-chip integrated circuit; quality factor; resonance frequency; resonator vibration; size 0.35 mum; size 2 mm; size 35 mum; wafer-level vacuum seal; Electrodes; Electrostatics; Micromechanical devices; Noise; Noise measurement; Resonant frequency; Tuning;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
SENSORS, 2013 IEEE
Conference_Location :
Baltimore, MD
ISSN :
1930-0395
Type :
conf
DOI :
10.1109/ICSENS.2013.6688164
Filename :
6688164
Link To Document :
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