DocumentCode
656963
Title
Test and evaluation of a silicon resonant accelerometer implemented in SOI technology
Author
Xia Guo-ming ; Qiu An-ping ; Shi Qin ; Su Yan
Author_Institution
MEMS Inertial Technol. Res. Center, Nanjing Univ. of Sci. & Technol., Nanjing, China
fYear
2013
fDate
3-6 Nov. 2013
Firstpage
1
Lastpage
4
Abstract
This paper describes a silicon resonant accelerometer implemented in SOI technology. With fully differential design and micro-lever system, the accelerometer achieves a sensitivity of 82Hz/g with a nominal frequency of 30 kHz. The MEMS device is placed in a ceramic vacuum package, so gets a quality factor nearly 1e5. Readout circuit is also introduced which includes two differential oscillators and a double channel frequency measure circuit. A novel differential capacitance sense circuit employing high frequency carrier and diodes ring is used to avoid driving signal feed through. And a 90° phase shifter and AAC (automatic amplitude control) are also used to maintain phase and amplitude balance. The frequency measurement circuit is based on all digital multi-bit PLL (phase lock loop) technology, which is implemented by 18bit ADC and FPGA, the accuracy of each channel is better than 1mHz. The complete resonant accelerometer achieves 13.5μg/ √ Hz resolution and 3.6μg bias stability.
Keywords
Q-factor; accelerometers; analogue-digital conversion; capacitance; ceramic packaging; diodes; elemental semiconductors; field programmable gate arrays; frequency measurement; microsensors; oscillators; phase locked loops; phase shifters; readout electronics; silicon; silicon-on-insulator; AAC; ADC; FPGA; MEMS device; SOI technology; all digital multibit PLL; amplitude balance; automatic amplitude control; ceramic vacuum package; differential capacitance sense circuit; differential design; differential oscillator; diode ring; double channel frequency measurement circuit; frequency 30 kHz; high frequency carrier; microlever system; phase balance; phase lock loop; phase shifter; quality factor; readout circuit; silicon resonant accelerometer; Accelerometers; Capacitance; Frequency measurement; Noise; Oscillators; Resonant frequency; Sensors;
fLanguage
English
Publisher
ieee
Conference_Titel
SENSORS, 2013 IEEE
Conference_Location
Baltimore, MD
ISSN
1930-0395
Type
conf
DOI
10.1109/ICSENS.2013.6688238
Filename
6688238
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