• DocumentCode
    656965
  • Title

    Nano-precision force and displacement measurements using MEMS resonant structures

  • Author

    Mehdizadeh, Emad ; Guo, Xuemei ; Pourkamali, Siavash ; Hajjam, A. ; Rahafrooz, A.

  • Author_Institution
    Electr. Eng. Dept., Univ. of Texas at Dallas, Richardson, TX, USA
  • fYear
    2013
  • fDate
    3-6 Nov. 2013
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    This work presents a new approach for measuring sub-nano-Newton forces and sub-picometer displacements using MEMS resonators. Different versions of thermally actuated dual plate micromechanical resonators coupled to electrostatic actuators are utilized as highly sensitive force/displacement sensors. The force generated by the actuator strains the associated resonator changing its resonant frequency. Upon thorough characterization, this approach can be used as a reliable and accurate solution for force and displacement measurements in micro and nano-electromechancial systems. Frequency-force and displacement sensitivities as high as 17Hz/nN and 540 Hz/pm have been measured for the presented structures, respectively, showing the potential of such devices for sub-nanoscale force and displacement measurement resolutions.
  • Keywords
    displacement measurement; electrostatic actuators; force measurement; force sensors; frequency measurement; microfabrication; micromechanical resonators; microsensors; reliability; MEMS resonant structure; actuator strain generation; displacement measurement; electrostatic actuator coupling; frequency-force measurement; highly sensitive force-displacement sensor; microelectromechancial system; nanoelectromechancial system; nanoprecision force measurement; reliability; subnanoNewton force measurement; subpicometer displacement measurement; thermally actuated dual plate micromechanical resonator; Actuators; Displacement measurement; Force; Frequency measurement; Micromechanical devices; Resonant frequency; Sensors;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    SENSORS, 2013 IEEE
  • Conference_Location
    Baltimore, MD
  • ISSN
    1930-0395
  • Type

    conf

  • DOI
    10.1109/ICSENS.2013.6688240
  • Filename
    6688240