• DocumentCode
    657088
  • Title

    In-Situ grown carbon nanotubes for enhanced CO2 detection in non-dispersive-infra-red system

  • Author

    De Luca, A. ; Racz, Z. ; Cole, M.T. ; Ali, Syed Zishan ; Udrea, F. ; Gardner, Julian W. ; Milne, W.I.

  • Author_Institution
    Dept. of Eng., Univ. of Cambridge, Cambridge, UK
  • fYear
    2013
  • fDate
    3-6 Nov. 2013
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    Non-dispersive-infra-red (NDIR) sensors are believed to be one of the most selective and robust solutions for CO2 detection, though cost prohibits their broader integration. In this paper we propose a commercially viable silicon-on-insulator (SOI) complementary metal-oxide (CMOS) micro-electro-mechanical (MEMS) technology for an IR thermal emitter. For the first time, vertically aligned multi walled carbon nanotubes (VA-MWCNTs) are suggested as a possible coating for the enhancement of the emission intensity of the optical source of a NDIR system. VA-MWCNTs have been grown in situ by chemical vapour deposition (CVD) exclusively on the heater area. Optical microscopy, scanning electron microscopy and Raman spectroscopy have been used to verify the quality of the VA-MWCNTs growth. The CNT-coated emitter demonstrated an increased response to CO2 of approx. 60%. Furthermore, we show that the VA-MWCNTs are stable up to temperatures of 500 °C for up to 100 hours.
  • Keywords
    CMOS integrated circuits; CVD coatings; Raman spectroscopy; carbon; carbon compounds; carbon nanotubes; gas sensors; infrared detectors; microsensors; nanosensors; optical microscopy; scanning electron microscopy; silicon-on-insulator; C; CMOS; CNT coated emitter; CO2; CVD; IR thermal emitter; MEMS technology; NDIR sensor; Raman spectroscopy; SOI; Si; VA-MWCNT growth; chemical vapour deposition; complementary metal oxide semiconductor; emission intensity enhancement; enhanced CO2 detection; heater area; in-situ grown carbon nanotube; microelectromechanical technology; nondispersive infrared system; optical microscopy; optical source; quality verification; scanning electron microscopy; silicon on insulator; temperature 500 degC; vertically aligned multiwalled carbon nanotube; Carbon nanotubes; Detectors; Heating; Optical detectors; Stimulated emission;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    SENSORS, 2013 IEEE
  • Conference_Location
    Baltimore, MD
  • ISSN
    1930-0395
  • Type

    conf

  • DOI
    10.1109/ICSENS.2013.6688370
  • Filename
    6688370