DocumentCode :
657120
Title :
2-D model of the indirectly-heated type microwave power sensor based on GaAs MMIC process
Author :
Zhenxiang Yi ; Xiaoping Liao ; Hao Wu
Author_Institution :
Key Lab. of MEMS of the Minist. of Educ., Southeast Univ., Nanjing, China
fYear :
2013
fDate :
3-6 Nov. 2013
Firstpage :
1
Lastpage :
4
Abstract :
In this paper, a novel two-dimensional (2-D) model is established to describe the temperature distribution of the indirectly-heated type microwave power sensor. Fourier series is applied to obtain the solution of the heat transfer equation based on the boundary conditions. Finite-element method (FEM) analysis is performed to verify the 2-D model and the simulation shows that the 2-D model is more accurate than the existing 1-D model. The power sensor is fabricated by GaAs MMIC process and MEMS technology. Au is chosen for the transmission line and the measuring pad, TaN is fabricated to form the two loaded resistors. Power measurement is accomplished from 0-100mW under 0.1GHz, 0.5GHz, 1GHz, 5GHz and 10GHz, and the sensitivities are 0.26mV/mW, 0.25mV/mW, 0.23mV/mW, 0.19mV/mW and 0.16mV/mW, respectively. The measured results demonstrate that the 2-D model agrees with the measurement well at low frequency. However, errors increase at high frequency because of electromagnetic coupling loss of the transmission line and the parasitic loss of the load resistors.
Keywords :
Fourier series; MMIC; finite element analysis; gallium arsenide; gold; heat transfer; microsensors; microwave detectors; microwave measurement; power measurement; tantalum compounds; Au; Fourier series; GaAs; MEMS technology; MMIC process; TaN; electromagnetic coupling; finite element method; frequency 0.1 GHz; frequency 0.5 GHz; frequency 1 GHz; frequency 10 GHz; frequency 5 GHz; heat transfer equation; indirectly heated type microwave power sensor; load resistor; loaded resistor; measuring pad; parasitic loss; power 100 mW; transmission line; Electromagnetic heating; Finite element analysis; Load modeling; Mathematical model; Microwave circuits; Resistors; Transmission line measurements;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
SENSORS, 2013 IEEE
Conference_Location :
Baltimore, MD
ISSN :
1930-0395
Type :
conf
DOI :
10.1109/ICSENS.2013.6688404
Filename :
6688404
Link To Document :
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