DocumentCode :
657130
Title :
Thickness dependent adhesion force and its correlation to surface roughness in multilayered graphene
Author :
Pourzand, Hoorad ; Pai, Pradeep ; Tabib-Azar, Massood
Author_Institution :
Dept. of Electr. & Comput. Eng., Univ. of Utah, Salt Lake City, UT, USA
fYear :
2013
fDate :
3-6 Nov. 2013
Firstpage :
1
Lastpage :
4
Abstract :
In this paper adhesion force of multi-layered graphene films with different thickness is experimentally determined and studied for the first time. In thin graphene layers, the adhesion force increases with decreasing thickness and approaches that of substrate which is correlated to Van Der Waals force transparency of mono-layer graphene. In very thick graphene layers, a rise in adhesion force is seen which we correlate to surface roughness changes of the substrate. Simple models for measuring adhesion force for a flat surface with sub-nanometer roughness and tip-radius scale roughness are proposed. Based on these models we understand that small surface roughness decreases adhesion force while large roughness will increase the adhesion force. This deduction is corroborated by the experimental data obtained from adhesion force measurements. It is also shown that roughness in the scale of AFM tip-radius can double the adhesion force easily and surface roughness plays an important role in the adhesion force measurements.
Keywords :
adhesion; atomic force microscopy; force measurement; graphene; surface roughness; van der Waals forces; AFM tip-radius; C; Van Der Waals force transparency; adhesion force measurement; flat surface; multilayered graphene; subnanometer roughness; surface roughness; thickness dependent adhesion force; tip-radius scale roughness; Adhesives; Force; Force measurement; Graphene; Rough surfaces; Substrates; Surface roughness;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
SENSORS, 2013 IEEE
Conference_Location :
Baltimore, MD
ISSN :
1930-0395
Type :
conf
DOI :
10.1109/ICSENS.2013.6688415
Filename :
6688415
Link To Document :
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